JIS标准
- JIS C 5932-2006 General rules of optical isolators
- JIS C 5948-2007 通信用激光模块.可靠性评估
- JIS C 5952-1-2008 纤维光学有源元件及器件.包装和接口标准.第1部分总则和指南
- JIS C 5952-2-2008 纤维光学有源元件及器件.包装和接口标准.第2部分SFF MT-RJ 10-pin收发器
- JIS C 5952-3-2008 纤维光学有源元件及器件.包装和接口标准.第3部分SFF MT-RJ 20-pin收发器
- JIS C 5952-4-2008 纤维光学有源元件及器件.包装和接口标准.第4部分PN 1x9塑料光学纤维收发器
- JIS C 5952-5-2008 纤维光学有源元件及器件.包装和接口标准.第5部分SC 1x9光学纤维模块
- JIS C 5952-6-2008 纤维光学有源元件及器件.包装和接口标准.第6部分ATM-PON收发器
- JIS C 5952-7-2008 纤维光学有源元件及器件.包装和接口标准.第7部分SFF LC 10-pin收发器
- JIS C 5952-8-2008 纤维光学有源元件及器件.包装和接口标准.第8部分SFF LC 20-pin收发器
- JIS C 5952-9-2008 纤维光学有源元件及器件.包装和接口标准.第9部分SFF MU双重10-pin收发器
- JIS C 5952-10-2008 纤维光学有源元件及器件.包装和接口标准.第10部分SFF MU双重20-pin收发器
- JIS C 5402-11-11-2005 Connectors for electronic equipment -- Tests and measurements -- Part 11-11- Climatic tests -- Test 11k- Low air pressure
- JIS C 5402-11-12-2005 Connectors for electronic equipment -- Tests and measurements -- Part 11-12- Climatic tests -- Test 11m- Damp heat, cyclic
- JIS C 5402-11-14-2006 Connectors for electronic equipment Tests and measurements Part 11-14 Climatic tests Test 11p Flowing single gas corrosion test
- JIS C 5402-16-20-2002 Mechanical tests on contacts and terminations -- Test 16t- Mechanical strength (wired termination of solderless co
- JIS C 5402-19-3-2002 Connectors for electronic equipment -- Tests and measurements -- Part 19-3- Chemical resistance tests -- Test 19c- Fluid resistance
- JIS C 5402-20-2-2005 Electromechanical components for electronic equipment -- Basic testing procedures and measuring methods -- Part 20-2- Test 20b -- Flammability tests -- Fireproofness
- JIS C 5402-23-3-2005 电子设备用电机元件.基本试验程序和测量方法.第23-3部分试验23c连接件和附件的屏蔽效应
- JIS C 5402-23-4-2006 电子设备用连接器.试验和测量.第23-4部分屏蔽试验和滤波试验.试验23d时域中的传输线反射
- JIS C 5402-1992 电子设备用连接器的试验方法
- JIS C 5412-1995 C02 type connectors for radio frequency coaxial cables
- JIS C 5413-1995 射频同轴电缆用C03型连接器
- JIS C 5415-1995 射频同轴电缆用C05型连接器
- JIS C 5432-1994 录音磁带的试验方法
- JIS C 5533-1-2008 Audio and audiovisual equipment-Digital audio parts- Basic measurement methods of audio characteristics- Part 1 General
- JIS C 5533-2-2008 Audio and audiovisual equipment-Digital audio parts- Basic measurement methods of audio characteristics- Part 2 Consumer use
- JIS C 5533-4-2008 Audio and audiovisual equipment-Digital audio parts- Basic measurement methods of audio characteristics- Part 4 Personal computer
- JIS C 5600-2006 Glossary of basic terms used in electrotechnology
- JIS C 5630-1-2008 Semiconductor devicesMicro-electromechanical devices Part 1 Terms and definitions
- JIS C 5630-2-2009 Semiconductor devices-Micro-electromechanical devices- Part 2 Tensile testing method of thin film materials
- JIS C 5630-3-2009 Semiconductor devices-Micro-electromechanical devices- Part 3 Thin film standard test piece for tensile testing
- JIS C 5402-1-100-2005 Connectors for electronic equipment -- Tests and measurements -- Part 1-100- General -- Applicable publications
- JIS C 5402-1-2002 Connectors for electronic equipment -- Tests and measurements -- Part 1- General
- JIS C 5402-2-1-2004 电子设备连接器.试验和测量.第2-1部分电连续性和接触电阻试验.试验2a接触电阻.毫伏电平仪法
- JIS C 5402-2-3-2005 Connectors for electronic equipment -- Tests and measurements -- Part 2-3- Electrical continuity and contact resistance tests -- Test 2c- Contact resistance variation
- JIS C 5402-2-5-2005 Connectors for electronic equipment -- Tests and measurements -- Part 2-5- Electrical continuity and contact resistance tests -- Test 2e- Contact disturbance
- JIS C 5402-2-6-2005 Electrical continuity and contact resistance tests -- Test 2f- Housing (shell) electrical continuity
- JIS C 5402-3-1-2005 Connectors for electronic equipment -- Tests and measurements -- Part 3-1- Insulation tests -- Test 3a- Insulation resistance
- JIS C 5402-4-1-2005 Connectors for electronic equipment -- Tests and measurements -- Part 4-1- Voltage stress tests -- Test 4a- Voltage proof